DAC
2005
ACM
15 years 15 days ago
2005
ACM
Since across-chip interconnect delays can exceed a clock cycle in nanometer technologies, it has become essential in high performance designs to add flip-flops on wires with multi...
DAC
2005
ACM
15 years 15 days ago
2005
ACM
As the process technology enters the nanometer era, reliability has become a major concern in the design and manufacturing of VLSI circuits. In this paper we focus on one reliabil...
DAC
2005
ACM
15 years 15 days ago
2005
ACM
Physical phenomena such as temperature have an increasingly important role in performance and reliability of modern process technologies. This trend will only strengthen with futu...
DAC
2005
ACM
15 years 15 days ago
2005
ACM
We present several improvements to general-purpose sequential redundancy removal. First, we propose using a robust variety of synergistic transformation and verification algorithm...
DAC
2005
ACM
15 years 15 days ago
2005
ACM
DAC
2005
ACM
15 years 15 days ago
2005
ACM
Channel estimation and multiuser detection are enabling technologies for future generations of wireless applications. However, sophisticated algorithms are required for accurate c...
DAC
2005
ACM
15 years 15 days ago
2005
ACM
This paper presents a unifying framework for the modeling of asynchronous pipeline circuits. A pipeline protocol is captured in a graph-based model which defines the partial order...
DAC
2005
ACM
15 years 15 days ago
2005
ACM
DAC
2005
ACM
15 years 15 days ago
2005
ACM
As feature sizes shrink, transient failures of on-chip network links become a critical problem. At the same time, many applications require guarantees on both message arrival prob...
DAC
2005
ACM
15 years 15 days ago
2005
ACM
Power minimization under variability is formulated as a rigorous statistical robust optimization program with a guarantee of power and timing yields. Both power and timing metrics...