DAC
2006
ACM
15 years 14 days ago
2006
ACM
Deploying multiple supply voltages (multi-Vdds) on one chip is an important technique to reduce dynamic power consumption. In this work we present an optimality study for resource...
DAC
2006
ACM
15 years 14 days ago
2006
ACM
As the technology node advances into the nanometer era, via-open defects are one of the dominant failures. To improve via yield and reliability, redundant-via insertion is a highl...
DAC
2006
ACM
15 years 14 days ago
2006
ACM
For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. ali...
DAC
2006
ACM
15 years 14 days ago
2006
ACM
A novel method to solve the state encoding problem in Signal Transition Graphs is presented. It is based on the structural theory of Petri nets and can be applied to large specifi...
DAC
2006
ACM
15 years 14 days ago
2006
ACM
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
DAC
2006
ACM
15 years 14 days ago
2006
ACM
In this paper, we propose an adaptive low-power bus encoding algorithm based on weighted code mapping (WCM) and the delayed bus technique. The WCM algorithm transforms an original...
DAC
2006
ACM
15 years 14 days ago
2006
ACM
Increasing resistivity of copper with scaling and rising demands on current density requirements are driving the need to identify new wiring solutions for deep nanometer scale VLS...
DAC
2006
ACM
15 years 14 days ago
2006
ACM
In this paper, we present a method that helps improve the performance of Bounded Model Checking by automatically strengthening invariants so that the termination proof may be obta...
DAC
2006
ACM
15 years 14 days ago
2006
ACM
In this paper, we propose an exact algorithm for the problem of area optimization under a delay constraint in the synthesis of multiplierless FIR filters. To the best of our knowl...
DAC
2006
ACM
15 years 14 days ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...