DFT
2005
IEEE
14 years 5 months ago
2005
IEEE
As digital imagers grow in pixel count and area, the ability to correct for pixel defects becomes more important. A fault tolerant Active Pixel Sensor (APS) has previously been de...
DFT
2005
IEEE
14 years 5 months ago
2005
IEEE
In this paper, we present two novel methodologies for testing the interconnect fabrics of network-on-chip (NoC) based chips. Both use the concept of recursive testing, with differ...
DFT
2005
IEEE
14 years 5 months ago
2005
IEEE
DFT
2005
IEEE
14 years 5 months ago
2005
IEEE
This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in Automatic Test Equipment (ATE). The separate components are analyzed individually an...
DFT
2005
IEEE
14 years 5 months ago
2005
IEEE
DFT
2005
IEEE
14 years 5 months ago
2005
IEEE
Detection of defective pixels that develop on-line is a vital part of fault tolerant schemes for repairing imagers during operation. This paper presents a new algorithm for the id...
DFT
2005
IEEE
14 years 5 months ago
2005
IEEE
Defect and fault tolerance is being studied in a 3D Heterogeneous Sensor using a stacked chip with sensors located on the top plane, and inter-plane vias connecting these to other...
DFT
2005
IEEE
14 years 5 months ago
2005
IEEE
Sequential elements, flip-flops, latches, and memory cells, are the most vulnerable components to soft errors. Since state-of-the-art designs contain millions of bistables, it i...
DFT
2005
IEEE
14 years 5 months ago
2005
IEEE
We propose a novel system-level error tolerance approach specifically targeted for multimedia compression algorithms. In particular we focus on the motion estimation process perf...
DFT
2005
IEEE
14 years 5 months ago
2005
IEEE
In this paper, we propose a system-level error tolerance scheme for systems where a linear transform is combined with quantization. These are key components in multimedia compress...