ETS
2009
IEEE
13 years 9 months ago
2009
IEEE
This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both ...
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 9 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
ETS
2009
IEEE
13 years 9 months ago
2009
IEEE
We optimize the full-response diagnostic fault dictionary from a given test set. The smallest set of vectors is selected without loss of diagnostic resolution of the given test se...
ETS
2009
IEEE
13 years 9 months ago
2009
IEEE
Scan circuit generally causes excessive switching activity compared to normal circuit operation. The higher switching activity in turn causes higher peak power supply current whic...
ETS
2009
IEEE
13 years 9 months ago
2009
IEEE
Structural on-line self-test may be performed to detect permanent faults and avoid their accumulation. This paper improves concurrent BIST techniques based on a deterministic test ...