We describe a novel iterationless approach for computing the effective capacitance of an interconnect load at a driving gate output. Our new approach is considerably faster than p...
This paper presents a new Design for Testability (DFT) technique for Current-Mode Logic (CML) circuits. This new technique, with little overhead, using built-in detectors, monitor...
Bernard Antaki, Yvon Savaria, Nanhan Xiong, Saman ...