ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
— We have entered an era where chip yields are decreasing with scaling. A new concept called intelligible testing has been previously proposed with the goal of reversing this tre...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
— Leakage power dissipation becomes a dominant component in operation power in nanometer devices. This paper describes a design methodology to implement runtime power gating in a...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
— Traditional level-one instruction caches and data caches for embedded systems typically have the same capacities. Configurable caches either shut down a part of the cache to su...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
Reed-Solomon (RS) codes are among the most widely utilized error-correcting codes in modern communication and computer systems. Among the decoding algorithms of RS codes, the rece...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
—Reducing energy consumption is an important issue for battery powered embedded computing systems. Content Addressable Memory (CAM)-based Highly-Associative Caches (HAC) are wide...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effecti...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
—The technique of module-threading utilizes standard DDR DRAM components to build modified memory modules. These modified modules incorporate one or more additional control signa...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
—Field-Programmable Gate Array (FPGA) technology is characterized by continuous improvements that provide new opportunities in system design. Multiprocessors-ona-Programmable-Chi...