DSD
2005
IEEE
14 years 2 months ago
2005
IEEE
1 This paper presents a method for power-constrained system-on-chip test scheduling in an abort-on-first-fail environment where the test is terminated as soon as a fault is detecte...
DSD
2005
IEEE
14 years 2 months ago
2005
IEEE
Transport Triggered Architecture (TTA) offers a costeffective trade-off between the size and performance of ASICs and the programmability of general-purpose processors. In this pa...
DFT
2005
IEEE
14 years 2 months ago
2005
IEEE
Fabricating large memory and processor arrays is subject to physical failures resulting in yield degradation. The strategy of incorporating spare rows and columns to obtain reason...
DFT
2005
IEEE
14 years 2 months ago
2005
IEEE
Data flow graph dominant designs, such as communication video and audio applications, are common in today’s IC industry. In these designs, the datapath resources (e.g., adders,...
DFT
2005
IEEE
14 years 2 months ago
2005
IEEE
SRAM-based Field Programmable Gate Arrays (FPGAs) are very susceptible to Single Event Upsets (SEUs) that may have dramatic effects on the circuits they implement. In this paper w...
DFT
2005
IEEE
14 years 2 months ago
2005
IEEE
This paper presents a new test methodology which utilizes the Programming Language Interface (PLI) for performing fault simulation of combinational or full scan Intellectual Prope...
DFT
2005
IEEE
14 years 2 months ago
2005
IEEE
The present paper proposes a new method for detecting arbitrary faults in a functional circuit when the set of codewords is limited and known in advance. The method is based on im...
DFT
2005
IEEE
14 years 2 months ago
2005
IEEE
This paper analyzes the deposition defects in devices and circuits made of Quantum-dot Cellular Automata (QCA) for molecular implementation. Differently from metal-based QCA, in ...
DFT
2005
IEEE
14 years 2 months ago
2005
IEEE
A new jitter model is developed using Matlab and Spice to analyze Data Dependent Jitter (DDJ) in serial data integrated circuits. The simulation results show that DDJ is dependent...
DFT
2005
IEEE
14 years 2 months ago
2005
IEEE
As digital imagers grow in pixel count and area, the ability to correct for pixel defects becomes more important. A fault tolerant Active Pixel Sensor (APS) has previously been de...