MICRO
2006
IEEE
14 years 3 months ago
2006
IEEE
Although processor design verification consumes ever-increasing resources, many design defects still slip into production silicon. In a few cases, such bugs have caused expensive...
MICRO
2006
IEEE
14 years 3 months ago
2006
IEEE
As the industry moves toward larger-scale chip multiprocessors, the need to parallelize applications grows. High inter-thread communication delays, exacerbated by over-stressed hi...
MICRO
2006
IEEE
14 years 3 months ago
2006
IEEE
Computer security is severely threatened by software vulnerabilities. Prior work shows that information flow tracking (also referred to as taint analysis) is a promising techniqu...
MICRO
2006
IEEE
14 years 3 months ago
2006
IEEE
One of the major issues faced by the semiconductor industry today is that of reducing chip yields. As the process technologies have scaled to smaller feature sizes, chip yields ha...
MICRO
2006
IEEE
14 years 3 months ago
2006
IEEE
We propose and evaluate a multi-thread memory scheduler that targets high performance CMPs. The proposed memory scheduler is based on concepts originally developed for network fai...
MICRO
2006
IEEE
14 years 3 months ago
2006
IEEE
Power delivery is a growing reliability concern in microprocessors as the industry moves toward feature-rich, powerhungrier designs. To battle the ever-aggravating power consumpti...
MICRO
2006
IEEE
14 years 3 months ago
2006
IEEE
Ring interconnects may be an attractive solution for future chip multiprocessors because they can enable faster links than buses and simpler switches than arbitrary switched inter...
MICRO
2006
IEEE
14 years 3 months ago
2006
IEEE
VLIW and EDGE (Explicit Data Graph Execution) architectures rely on compilers to form high-quality hyperblocks for good performance. These compilers typically perform hyperblock f...
MICRO
2006
IEEE
14 years 3 months ago
2006
IEEE
Dynamic software bug detection tools are commonly used because they leverage run-time information. However, they suffer from a fundamental limitation, the Path Coverage Problem: t...
MICRO
2006
IEEE
14 years 3 months ago
2006
IEEE
Design variability due to die-to-die and within-die process variations has the potential to significantly reduce the maximum operating frequency and the effective yield of high-p...