DFT
2006
IEEE
14 years 3 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
DFT
2006
IEEE
14 years 3 months ago
2006
IEEE
Abstract— This paper proposes the control of monomer concentration as a novel improvement of the kinetic Tile Assembly Model (kTAM) to reduce the error rate in DNA selfassembly. ...
DFT
2006
IEEE
14 years 3 months ago
2006
IEEE
Control flow checking (CFC) is a well known concurrent checking technique for ensuring that a program’s instruction execution sequence follows permissible paths. Almost all CFC...
DFT
2006
IEEE
14 years 3 months ago
2006
IEEE
A Fault Tolerant Active Pixel Sensor (FTAPS) has been designed and fabricated to correct for point defects that occur in CMOS image sensors both at manufacturing and over the life...
DFT
2006
IEEE
14 years 3 months ago
2006
IEEE
In this paper we will introduce a novel approach for the on-chip generation of a faulttolerant clock. We will motivate why it becomes more and more desirable to provide VLSI circu...
DFT
2006
IEEE
14 years 3 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
DFT
2006
IEEE
14 years 3 months ago
2006
IEEE
Continued increase in complexity of digital image sensors means that defects are more likely to develop in the field, but little concrete information is available on in-field defe...
DFT
2006
IEEE
14 years 3 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
DFT
2006
IEEE
14 years 3 months ago
2006
IEEE
Dual core architectures are commonly used to establish fault tolerance on the node level. Since comparison is usually performed for the outputs only, no precise diagnostic informa...
DDECS
2006
IEEE
14 years 3 months ago
2006
IEEE
: An embedded rectifier-based Built-In-Test (BIT) detection circuit for the RF integrated circuits is proposed in this work, and charge pump rectifier is adopted to transform the R...