DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
State of the art statistical timing analysis (STA) tools often yield less accurate results when timing variables become correlated. Spatial correlation and correlation caused by p...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
This paper presents an RSA hardware design that simultaneously achieves high-performance and lowpower. A bit-oriented, split modular multiplication algorithm and architecture are ...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
This paper presents novel double sampling high order single-loop sigma-delta modulator structures for wideband applications. To alleviate the quantization noise folding into the i...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
This paper presents a systematic and optimal design of hybrid cascode compensation method which is used in fully differential two-stage CMOS operational transconductance amplifier...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
In this paper, a wavelet based approach is proposed for the model order reduction of linear circuits in time domain. Compared with Chebyshev reduction method, the wavelet reductio...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
Verification quality is a must for functional safety in electronic systems. In automotive, the verification flow is historically based on a layered approach, where each level (mod...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
With the increasing complexity and heterogeneity of embedded electronic systems, a unified design methodology at evels of abstraction becomes a necessity. Meanwhile, it is also i...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
In this paper, we propose a timing-reasoning algorithm to improve the resolution of delay fault diagnosis. In contrast to previous approaches which identify candidates by utilizin...