Sciweavers

FCCM
2007
IEEE
169views VLSI» more  FCCM 2007»
14 years 3 months ago
FPGA-Based Multigrid Computation for Molecular Dynamics Simulations
Abstract: FPGA-based acceleration of molecular dynamics (MD) has been the subject of several recent studies. Implementing long-range forces, however, has only recently been address...
Yongfeng Gu, Martin C. Herbordt
ETS
2007
IEEE
105views Hardware» more  ETS 2007»
14 years 3 months ago
Communication-Centric SoC Debug Using Transactions
— The growth in System-on-Chip complexity puts pressure on system verification. Due to limitations in the pre-silicon verification process, errors in hardware and software slip...
Bart Vermeulen, Kees Goossens, Remco van Steeden, ...
ETS
2007
IEEE
110views Hardware» more  ETS 2007»
14 years 3 months ago
Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement
— A novel statistical learning algorithm is proposed to accurately analyze volume diagnosis results. This algorithm effectively overcomes the inherent ambiguities in logic diagno...
Huaxing Tang, Manish Sharma, Janusz Rajski, Martin...
ETS
2007
IEEE
109views Hardware» more  ETS 2007»
14 years 3 months ago
Test Configurations for Diagnosing Faulty Links in NoC Switches
The paper proposes a new concept of diagnosing faulty links in Network-on-a-Chip (NoC) designs. The method is based on functional fault models and it implements packet address dri...
Jaan Raik, Raimund Ubar, Vineeth Govind
ETS
2007
IEEE
94views Hardware» more  ETS 2007»
14 years 3 months ago
An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Therefore embedded memories are commonly equipped with spare r...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...
ETS
2007
IEEE
102views Hardware» more  ETS 2007»
14 years 3 months ago
Adaptive Debug and Diagnosis without Fault Dictionaries
Stefan Holst, Hans-Joachim Wunderlich
ETS
2007
IEEE
91views Hardware» more  ETS 2007»
14 years 3 months ago
PPM Reduction on Embedded Memories in System on Chip
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests a...
Said Hamdioui, Zaid Al-Ars, Javier Jiménez,...
ETS
2007
IEEE
81views Hardware» more  ETS 2007»
14 years 3 months ago
Parallel Scan-Like Testing and Fault Diagnosis Techniques for Digital Microfluidic Biochips
Dependability is an important attribute for microfluidic biochips that are used for safety-critical applications such as point-of-care health assessment, air-quality monitoring, a...
Tao Xu, Krishnendu Chakrabarty
ECBS
2007
IEEE
97views Hardware» more  ECBS 2007»
14 years 3 months ago
A Service-Oriented Extension of the V-Modell XT
The ever growing size and complexity of both technical and business systems requires efficient software engineering approaches to keep development cost under control while still ...
Michael Meisinger, Ingolf Krüger
ECBS
2007
IEEE
122views Hardware» more  ECBS 2007»
14 years 3 months ago
Time- and Space-Efficient Evaluation of Sparse Boolean Functions in Embedded Software
The paper addresses software implementation of large sparse systems of Boolean functions. Fast evaluation of such functions with the smallest memory consumption is often required ...
Vaclav Dvorak