DSD
2007
IEEE
14 years 3 months ago
2007
IEEE
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be used in combination with the column-matching based built-in self-test design meth...
DSD
2007
IEEE
14 years 3 months ago
2007
IEEE
Developing highly efficient and reliable embedded systems demands hardware/software (HW/SW) co-design and, therefore, co-simulation. In order to be highly configurable, embedded...
DSD
2007
IEEE
14 years 3 months ago
2007
IEEE
The reduction of the cumbersome operations of multiplication, division, and powering to addition, subtraction and multiplication is what makes the Logarithmic Number System (LNS) ...
DSD
2007
IEEE
14 years 3 months ago
2007
IEEE
DSD
2007
IEEE
14 years 3 months ago
2007
IEEE
Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability id...
DSD
2007
IEEE
14 years 3 months ago
2007
IEEE
Abstract—Localization is one of the most challenging and important issues in wireless sensor networks (WSNs), especially if cost-effective approaches are demanded. In this paper,...
DSD
2007
IEEE
14 years 3 months ago
2007
IEEE
DSD
2007
IEEE
14 years 3 months ago
2007
IEEE
Synchronous Data Flow Graphs (SDFGs) are a very useful means for modeling and analyzing streaming applications. Some performance indicators, such as throughput, have been studied b...
DSD
2007
IEEE
14 years 3 months ago
2007
IEEE
During synthesis of circuits for Boolean functions area, delay and testability are optimization goals that often contradict each other. Multi-level circuits are often quite small ...
DSD
2007
IEEE
14 years 3 months ago
2007
IEEE
This paper presents an optimized fault diagnosing procedure applicable in Built-in Self-Test environments. Instead of the known approach based on a simple bisection of patterns in...