In high-level synthesis for FPGA designs, scheduling and chaining of operations for optimal performance remain challenging problems. In this paper, we present a balanced schedulin...
David Zaretsky, Gaurav Mittal, Robert P. Dick, Pri...
We present a methodology for the simulation of soft errors targeting future nano-technological devices. This approach efficiently scales the failure rate of individual devices ac...
Christian J. Hescott, Drew C. Ness, David J. Lilja
For emerging deep-subwavelength lithography technologies (90 nm and following) the data volume and the complexity of Optical Proximity Correction (OPC) have increased dramatically...
The virtual channel flow control (VCFC) provides an efficient implementation for on-chip networks. However, allocating the virtual channels (VCs) uniformly results in a waste of a...
Errors caused by tolerance variations and mismatches among components severely degrade the performance of integrated circuits. These random effects in process parameters significa...
Juan Pablo Martinez Brito, Hamilton Klimach, Sergi...
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...
In this paper, we propose a generalized block structure-preserving reduced order interconnect macromodeling method (BSPRIM). Our approach extends structure-preserving model order ...
Ning Mi, Boyuan Yan, Sheldon X.-D. Tan, Jeffrey Fa...