ICASSP
2011
IEEE
13 years 3 months ago
2011
IEEE
In a large-scale language detection task, performance variation found between different component systems and different target languages has an adverse effect to the pooled error ...
ICCAD
2009
IEEE
13 years 9 months ago
2009
IEEE
Double patterning lithography (DPL) is a likely resolution enhancement technique for IC production in 32nm and below technology nodes. However, DPL gives rise to two independent, ...
AUTOMATICA
2002
13 years 11 months ago
2002
Abstract. The proper measure of closed-loop performance variation in the presence of modelplant mismatch is discussed in this paper. A generalized closed-loop error transfer functi...
ISVLSI
2008
IEEE
14 years 5 months ago
2008
IEEE
As integrated circuits are scaled down it becomes difficult to maintain uniformity in process parameters across each individual die. The resulting performance variation requires ...