Sciweavers

DAC
2011
ACM
12 years 11 months ago
Fast non-monte-carlo transient noise analysis for high-precision analog/RF circuits by stochastic orthogonal polynomials
Stochastic device noise has become a significant challenge for high-precision analog/RF circuits, and it is particularly difficult to correctly include both white noise and flic...
Fang Gong, Hao Yu, Lei He
ICCAD
1997
IEEE
76views Hardware» more  ICCAD 1997»
14 years 3 months ago
Simulation methods for RF integrated circuits
Abstract — The principles employed in the development of modern RF simulators are introduced and the various techniques currently in use, or expected to be in use in the next few...
Kenneth S. Kundert
DATE
2002
IEEE
77views Hardware» more  DATE 2002»
14 years 4 months ago
A Signature Test Framework for Rapid Production Testing of RF Circuits
Production test costs for today’s RF circuits are rapidly escalating. Two factors are responsible for this cost escalation: (a) the high cost of RF ATEs and (b) long test times ...
Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhi...
DATE
2003
IEEE
151views Hardware» more  DATE 2003»
14 years 4 months ago
Analysis and White-Box Modeling of Weakly Nonlinear Time-Varying Circuits
The architectural study of wireless communication systems typically requires simulations with high-level models for different analog and RF blocks. Among these blocks, frequency-t...
Petr Dobrovolný, Gerd Vandersteen, Piet Wam...