DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
Various X-filling methods have been proposed for reducing the shift and/or capture power in scan testing. The main drawback of these methods is that X-filling for low power leads t...
ITC
2003
IEEE
14 years 4 months ago
2003
IEEE
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing has become a critical problem. In our studies on practical LSI manufacturing, we ha...