VLSID
2002
IEEE
15 years 25 days ago
2002
IEEE
This paper considers reducing the cost of test application by permuting test vectors to improve their defect coverage. Algorithms for test reordering are developed with the goal o...
VLSID
2003
IEEE
15 years 25 days ago
2003
IEEE
Increasing values and spread in leakage current makes it impossible to distinguish between faulty and fault-free chips using single threshold method. Neighboring chips on a wafer ...