ICCD
2008
IEEE
14 years 8 months ago
2008
IEEE
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...
VLSID
2007
IEEE
14 years 12 months ago
2007
IEEE
Accurate electrical masking modeling represents a significant challenge in soft error rate analysis for combinational logic circuits. In this paper, we use table lookup MOSFET mode...
VLSID
2009
IEEE
15 years 4 days ago
2009
IEEE
We analyze the neutron induced soft error rate (SER). An induced error pulse is modeled by two parameters, probability of occurrence and probability density function of the pulse ...