ISVLSI
2008
IEEE
14 years 1 months ago
2008
IEEE
Re-using the network in a NoC-based system as a test access mechanism is an attractive solution as pointed out by several authors. As a consequence, testing of NoC-based SoCs is b...
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
Existing work on testing NoC-based systems advocates to reuse the on-chip network itself as test access mechanism (TAM) to transport test data to/from embedded cores. While this m...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Scan compression has emerged as the most successful solution to solve the problem of rising manufacturing test cost. Compression technology is not hierarchical in nature. Hierarch...
ICCAD
2001
IEEE
14 years 4 months ago
2001
IEEE
1 We propose an integrated technique for extensive optimization of the final test solution for System-on-Chip using Simulated Annealing. The produced results from the technique ar...