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ET
2002
115views more  ET 2002»
14 years 6 months ago
CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CASBUS that solves ...
Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki
DFT
2004
IEEE
101views VLSI» more  DFT 2004»
14 years 10 months ago
Designs for Reducing Test Time of Distributed Small Embedded SRAMs
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
Baosheng Wang, Yuejian Wu, André Ivanov
VTS
2005
IEEE
106views Hardware» more  VTS 2005»
15 years 7 days ago
Segmented Addressable Scan Architecture
This paper presents a test architecture that addresses multiple problems faced in digital IC testing. These problems are test data volume, test application time, test power consum...
Ahmad A. Al-Yamani, Erik Chmelar, Mikhail Grinchuc...
ETS
2006
IEEE
108views Hardware» more  ETS 2006»
15 years 22 days ago
A DFT Architecture for Asynchronous Networks-on-Chip
The Networks-on-Chip (NoCs) paradigm is emerging as a solution for the communication of SoCs. Many NoC architecture propositions are presented but few works on testing these netwo...
Xuan-Tu Tran, Jean Durupt, François Bertran...