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ATS
2004
IEEE
108views Hardware» more  ATS 2004»
14 years 3 months ago
Rapid and Energy-Efficient Testing for Embedded Cores
Conventional serial connection of internal scan chains brings the power and time penalty. A novel parallel core wrapper design (pCWD) approach is presented in this paper for reduc...
Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman ...
ATS
2005
IEEE
118views Hardware» more  ATS 2005»
14 years 5 months ago
Partial Gating Optimization for Power Reduction During Test Application
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
Mohammed ElShoukry, Mohammad Tehranipoor, C. P. Ra...
ASPDAC
2006
ACM
90views Hardware» more  ASPDAC 2006»
14 years 5 months ago
A routability constrained scan chain ordering technique for test power reduction
Abstract— For scan-based testing, the high test power consumption may cause test power management problems, and the extra scan chain connections may cause routability degradation...
X.-L. Huang, J.-L. Huang
VLSID
2004
IEEE
93views VLSI» more  VLSID 2004»
14 years 12 months ago
Random Access Scan: A solution to test power, test data volume and test time
Dong Hyun Baik, Kewal K. Saluja, Seiji Kajihara