COMCOM
1999
14 years 12 days ago
1999
We present a problem of commonly used characterization sequences (CS) for the protocol conformance testing and propose a new test sequence to resolve the problem. The proposed tes...
CN
1999
14 years 12 days ago
1999
An optimization method is introduced for generating minimum-length test sequences taking into account timing constraints for FSM models of communication protocols. Due to active t...
JCP
2008
14 years 21 days ago
2008
- Our paper focuses on the generation of optimal test sequences and test cases using Intelligent Agents for highly reliable systems. Test sequences support test case generation for...
ASE
2006
14 years 24 days ago
2006
Finite state machines have been used to model a number of classes of system and there has thus been much interest in the automatic generation of test sequences from finite state m...
FORTE
2003
14 years 2 months ago
2003
Abstract. In this paper, we propose a testing method for QoS functions in distributed multi-media systems, where we test whether playback of media objects is correctly implemented ...
ITC
1997
IEEE
14 years 5 months ago
1997
IEEE
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
DATE
1997
IEEE
14 years 5 months ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
EVOW
1999
Springer
14 years 5 months ago
1999
Springer
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...
ICCAD
1999
IEEE
14 years 5 months ago
1999
IEEE
We describe a method referred to as sequence counting to improve on the levels of compaction achievable by vector omission based static compaction procedures. Such procedures are ...
DATE
2006
IEEE
14 years 6 months ago
2006
IEEE
Transparent-scan was proposed as an approach to test generation and test compaction for scan circuits. Its effectiveness was demonstrated earlier in reducing the test application ...