SEU-Tolerant QDI Circuits

This paper addresses the issue of Single-Event Upset (SEU) in quasi delay-insensitive (QDI) asynchronous circuits. We show that an SEU can cause abnormal computations in QDI circuits beside deadlock, and we propose a general method to make QDI circuits SEU-tolerant. We present a simplified SEUtolerant buffer implementations for CMOS technology. Finally, we present a case study of a one-bit comparator and show SPICE-simulation results.

• Type: Conference
• Year: 2005
• Where: ASYNC
• Authors: Wonjin Jang, Alain J. Martin
• Keywords: ASYNC 2005, Asynchronous Circuits, Hardware, QDI Circuits, Single-event Upset