11 search results - page 1 / 3 » SEU-Tolerant QDI Circuits |
ISQED
2006
IEEE
14 years 4 months ago
2006
IEEE
Due to aggressive technology scaling, VLSI circuits are becoming increasingly susceptible to transient errors caused by single-event-upsets (SEUs). In this paper, we introduce two...
DAC
2005
ACM
14 years 25 days ago
2005
ACM
ASYNC
2005
IEEE
14 years 4 months ago
2005
IEEE
This paper addresses the issue of Single-Event Upset (SEU) in quasi delay-insensitive (QDI) asynchronous circuits. We show that an SEU can cause abnormal computations in QDI circu...
DATE
2005
IEEE
14 years 4 months ago
2005
IEEE
The purpose of this paper is to formally specify a flow devoted to the design of Differential Power Analysis (DPA) resistant QDI asynchronous circuits. The paper first proposes a ...
VLSI
2005
Springer
14 years 4 months ago
2005
Springer
Quasi delay insensitive circuits are functionally independent of delays in gates and wires (except for some particular wires). Such asynchronous circuits offer high robustness but...