In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
Samitha Samaranayake, Emil Gizdarski, Nodari Sitch...
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...