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» On the Fault Testing for Reversible Circuits
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VTS
2003
IEEE
115views Hardware» more  VTS 2003»
14 years 4 months ago
Fault Testing for Reversible Circuits
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...
Ketan N. Patel, John P. Hayes, Igor L. Markov
ISAAC
2007
Springer
131views Algorithms» more  ISAAC 2007»
14 years 5 months ago
On the Fault Testing for Reversible Circuits
This paper shows that it is NP-hard to generate a minimum complete test set for stuck-at faults on the wires of a reversible circuit. We also show non-trivial lower bounds for the ...
Satoshi Tayu, Shigeru Ito, Shuichi Ueno
ATS
2004
IEEE
116views Hardware» more  ATS 2004»
14 years 2 months ago
Testing for Missing-Gate Faults in Reversible Circuits
Logical reversibility occurs in low-power applications and is an essential feature of quantum circuits. Of special interest are reversible circuits constructed from a class of rev...
John P. Hayes, Ilia Polian, Bernd Becker
IEICET
2008
70views more  IEICET 2008»
13 years 11 months ago
On Fault Testing for Reversible Circuits
Satoshi Tayu, Shigeru Ito, Shuichi Ueno
ATS
2005
IEEE
164views Hardware» more  ATS 2005»
14 years 26 days ago
A Family of Logical Fault Models for Reversible Circuits
Reversibility is of interest in achieving extremely low power dissipation; it is also an inherent design requirement of quantum computation. Logical fault models for conventional ...
Ilia Polian, Thomas Fiehn, Bernd Becker, John P. H...