1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
As integrated circuit technology plumbs ever greater depths in the scaling of feature sizes, maintaining the paradigm of deterministic Boolean computation is increasingly challeng...
In this paper we present an efficient algorithm for extracting the complete statistical distribution of the input impedance of interconnect structures in the presence of a large n...
Current source based cell models are becoming a necessity for accurate timing and noise analysis at 65nm and below. Voltage waveform shapes are increasingly more difficult to repr...
Air cooling limits have been a major design challenge in recent years for integrated circuits. Multi-core exacerbates thermal challenges because power scales with the number of co...
Wei Huang, Mircea R. Stan, Karthik Sankaranarayana...
An energy optimization is proposed that addresses the nontrivial digital contribution to power and impact on performance in high-speed mixed-signal circuits. Parallel energy and b...
Single-chip parallel processing requires high bandwidth between processors and on-chip memory modules. A recently proposed Mesh-of-Trees (MoT) network provides high throughput and...