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    Reliability- and process-variation aware design of integrated circuits

    14 years 12 days ago
    Reliability- and process-variation aware design of integrated circuits
    Download  www.ewp.rpi.edu
    M. Alam
    claim paper
    Added 13 Dec 2010
    Updated 13 Dec 2010
    Type Journal
    Year 2008
    Where MR
    Authors M. Alam
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