Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
With increasing time-to-market pressure and shortening semiconductor product cycles, more and more chips are being designed with library-based methodologies. In spite of this shif...
Interrupt behaviors, especially the external ones, are difficult to verify in a microprocessor design project in that they involve both interacting hardware and software. This pap...
Increasing non-recurring engineering (NRE) and mask costs are making it harder to turn to hardwired Application Specific Integrated Circuit (ASIC) solutions for high performance a...
While Boolean logic minimization is typically used in logic synthesis, logic minimization can be useful in numerous other applications. However, many of those applications, such a...