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DAC
2009
ACM
14 years 8 months ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
DAC
2005
ACM
14 years 8 months ago
Device and architecture co-optimization for FPGA power reduction
Device optimization considering supply voltage Vdd and threshold voltage Vt tuning does not increase chip area but has a great impact on power and performance in the nanometer tec...
Lerong Cheng, Phoebe Wong, Fei Li, Yan Lin, Lei He
DAC
2005
ACM
14 years 8 months ago
Designing logic circuits for probabilistic computation in the presence of noise
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
DAC
2006
ACM
14 years 8 months ago
A novel variation-aware low-power keeper architecture for wide fan-in dynamic gates
Substantial increase in leakage current and threshold voltage fluctuations are making design of robust wide fan-in dynamic gates a challenging task. Traditionally, a PMOS keeper t...
Hamed F. Dadgour, Rajiv V. Joshi, Kaustav Banerjee
WWW
2006
ACM
14 years 8 months ago
Selective early request termination for busy internet services
Internet traffic is bursty and network servers are often overloaded with surprising events or abnormal client request patterns. This paper studies a load shedding mechanism called...
Jingyu Zhou, Tao Yang