In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
This paper introduces a CAD framework for co-simulation of hybrid circuits containing CMOS and SET (Single Electron Transistor) devices. An improved analytical model for SET is al...
Testing of high performance integrated circuits is becoming increasingly a challenging task owing to high clock frequencies. Often testers are not able to test such devices due to...
Hans G. Kerkhoff, Mansour Shashaani, Manoj Sachdev
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
In a faulty digital circuit, many (single) faulty gates may explain the observed findings. In this paper we are mostly concerned, not in obtaining alternative diagnoses, but rathe...