136 search results - page 2 / 28 » A Graph Reduction Approach to Symbolic Circuit Analysis |
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...
DATE
2002
IEEE
14 years 14 days ago
2002
IEEE
In this paper we introduce an approach for parameter controlled symbolic analysis of nonlinear analog circuits. Based on a state-of–the-art algorithm, it enables the removal of ...
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
DATE
2003
IEEE
14 years 24 days ago
2003
IEEE
A new method is presented to model symbolically strongly nonlinear circuits, characterized by Piece-Wise Linear (PWL) functions. The method follows the idea of Bokhoven and Leenae...