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» A Logical Viewpoint on Architectures
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VLSID
2008
IEEE
149views VLSI» more  VLSID 2008»
14 years 10 months ago
NBTI Degradation: A Problem or a Scare?
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
Kewal K. Saluja, Shriram Vijayakumar, Warin Sootka...
VLSID
2005
IEEE
255views VLSI» more  VLSID 2005»
14 years 10 months ago
Estimation of Switching Activity in Sequential Circuits Using Dynamic Bayesian Networks
We propose a novel, non-simulative, probabilistic model for switching activity in sequential circuits, capturing both spatio-temporal correlations at internal nodes and higher ord...
Sanjukta Bhanja, Karthikeyan Lingasubramanian, N. ...
VLSID
2002
IEEE
122views VLSI» more  VLSID 2002»
14 years 10 months ago
IEEE 1394a_2000 Physical Layer ASIC
CN4011A is IEEE 1394a_2000 standard Compliant Physical Layer ASIC. It is a 0.18um mixed-signal ASIC incorporating three analog ports, PLL, reference generator for analog along wit...
Ranjit Yashwante, Bhalchandra Jahagirdar
HPCA
2006
IEEE
14 years 10 months ago
An approach for implementing efficient superscalar CISC processors
An integrated, hardware / software co-designed CISC processor is proposed and analyzed. The objectives are high performance and reduced complexity. Although the x86 ISA is targete...
Shiliang Hu, Ilhyun Kim, Mikko H. Lipasti, James E...
HPCA
2003
IEEE
14 years 10 months ago
Power-Aware Control Speculation through Selective Throttling
With the constant advances in technology that lead to the increasing of the transistor count and processor frequency, power dissipation is becoming one of the major issues in high...
Juan L. Aragón, José González...