15 search results - page 2 / 3 » A Method to Diagnose Faults in Linear Analog Circuits using ... |
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
ICCBR
2003
Springer
14 years 20 days ago
2003
Springer
Abstract. There have been some Artificial Intelligence applications developed for electronic circuits diagnosis, but much remains to be done in this field, above all in the analo...
TCAD
2008
13 years 7 months ago
2008
Abstract--A key design constraint of circuits used in handheld devices is the power consumption, mainly due to battery life limitations. Adaptive power management (APM) techniques ...
DELTA
2008
IEEE
14 years 1 months ago
2008
IEEE
Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip failures. In this paper, ...
DAC
1996
ACM
13 years 11 months ago
1996
ACM
Abstract A divide-and-conquer algorithm for computing the parametric yield of large analog circuits is presented. The algorithm targets applications whose performance spreads could...