15 search results - page 3 / 3 » A Method to Diagnose Faults in Linear Analog Circuits using ... |
ASPDAC
2010
ACM
13 years 5 months ago
2010
ACM
In this paper, we propose a new wideband model order reduction method for interconnect circuits by using a novel adaptive sampling and error estimation scheme. We try to address t...
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
∗ Diagnosis is becoming a major concern with the rapid development of semiconductor memories. It provides information about the location of manufacturing defects in the memory, a...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
PATMOS
2007
Springer
14 years 1 months ago
2007
Springer
—Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the...
TCAD
2008
13 years 7 months ago
2008
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...