516 search results - page 9 / 104 » A Model for Timing Errors in Processors with Parameter Varia... |
IOLTS
2006
IEEE
14 years 1 months ago
2006
IEEE
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Existing approaches to timing analysis under uncertainty are based on restrictive assumptions. Statistical STA techniques assume that the full probabilistic distribution of parame...
IJCV
2006
13 years 7 months ago
2006
This paper explores various aspects of the image decomposition problem using modern variational techniques. We aim at splitting an original image f into two components u and v, whe...
VTS
2008
IEEE
14 years 1 months ago
2008
IEEE
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...
DAC
1999
ACM
13 years 11 months ago
1999
ACM
As interconnect feature sizes continue to scale to smaller dimensions, long interconnect can dominate the IC timing performance, but the interconnect parameter variations make it ...