465 search results - page 13 / 93 » A New Approach for Low Power Scan Testing |
DAC
2005
ACM
13 years 9 months ago
2005
ACM
This paper presents a new method for designing test wrappers for embedded cores with multiple clock domains. By exploiting the use of multiple shift frequencies, the proposed meth...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
ICC
2007
IEEE
14 years 1 months ago
2007
IEEE
—In this paper, a novel peak power reduction scheme based on trellis shaping is proposed for single-carrier pulseshaped phase shift keying (PSK) systems. The use of PSK generally...
ITC
2000
IEEE
13 years 11 months ago
2000
IEEE
Boards have evolved into complex systems and even collections of interacting systems. Test engineers struggle to find out how these systems are initialized and booted because of p...
ITC
1996
IEEE
13 years 11 months ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...