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DAC
2008
ACM
14 years 8 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
ISSS
2002
IEEE
106views Hardware» more  ISSS 2002»
14 years 19 days ago
Modeling Assembly Instruction Timing in Superscalar Architectures
This paper proposes an original model of the execution time of assembly instructions in superscalar architectures. The approach is based on a rigorous mathematical model and provi...
William Fornaciari, Vito Trianni, Carlo Brandolese...
OTM
2004
Springer
14 years 1 months ago
A Model-Driven Approach to Designing Cross-Enterprise Business Processes
Abstract. Modeling and managing business processes that span multiple organizations involves new challenges, mainly regarding the ability to cope with change, decentralization, and...
Bernhard Bauer, Jörg P. Müller, Stephan ...
WIRTSCHAFTSINFORMATI
2007
13 years 8 months ago
A Pattern based Approach for constructing Enterprise Architecture Management Information Models
: This paper sketches an approach to designing organization-specific information models for Enterprise Architecture (EA) Management based on patterns. Thus we intend to support th...
Sabine Buckl, Alexander M. Ernst, Josef Lankes, Ka...
ERLANG
2003
ACM
14 years 29 days ago
Extending the VoDKA architecture to improve resource modelling
VoDKA is a Video-on-Demand server developed using Erlang/OTP. In this paper, the evolution of the core architecture of the system, designed for improving resource modelling, is de...
Juan José Sánchez Penas, Carlos Abal...