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» A New Method for Design of Robust Digital Circuits
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ISQED
2010
IEEE
141views Hardware» more  ISQED 2010»
14 years 4 months ago
Assessing chip-level impact of double patterning lithography
—Double patterning lithography (DPL) provides an attractive alternative or a supplementary method to enable the 32nm and 22nm process nodes, relative to costlier technology optio...
Kwangok Jeong, Andrew B. Kahng, Rasit Onur Topalog...
ICRA
2000
IEEE
90views Robotics» more  ICRA 2000»
14 years 1 months ago
Effective Vehicle Teleoperation on the World Wide Web
Our goal is to make vehicle teleoperation accessible to all users. To do this, we are developing easy-to-use yet capable Web tools which enable efficient, robust teleoperation in...
Sébastien Grange, Terrence Fong, Charles Ba...
TCAD
2008
99views more  TCAD 2008»
13 years 9 months ago
MP-Trees: A Packing-Based Macro Placement Algorithm for Modern Mixed-Size Designs
In this paper, we present a new multipacking-tree (MP-tree) representation for macro placements to handle modern mixed-size designs with large macros and high chip utilization rate...
Tung-Chieh Chen, Ping-Hung Yuh, Yao-Wen Chang, Few...
DATE
2009
IEEE
155views Hardware» more  DATE 2009»
14 years 1 months ago
Automatically mapping applications to a self-reconfiguring platform
The inherent reconfigurability of SRAM-based FPGAs enables the use of configurations optimized for the problem at hand. Optimized configurations are smaller and faster than their g...
Karel Bruneel, Fatma Abouelella, Dirk Stroobandt
DAC
2008
ACM
14 years 10 months ago
Scan chain clustering for test power reduction
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...