117 search results - page 4 / 24 » A framework for statistical timing analysis using non-linear... |
DATE
2003
IEEE
14 years 19 days ago
2003
IEEE
The growing impact of within-die process variation has created the need for statistical timing analysis, where gate delays are modeled as random variables. Statistical timing anal...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
There is an increased dominance of intra-die process variations, creating a need for an accurate and fast statistical timing analysis. Most of the recent proposed approaches assum...
TCAD
2008
13 years 7 months ago
2008
Manufacturing process variations lead to variability in circuit delay and, if not accounted for, can cause excessive timing yield loss. The familiar traditional approaches to timin...
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
— As technology scales into the sub-90nm domain, manufacturing variations become an increasingly significant portion of circuit delay. As a result, delays must be modeled as sta...
VLSID
2005
IEEE
14 years 7 months ago
2005
IEEE
This paper employs general multivariate normal distribution to develop a new efficient statistical timing analysis methodology. The paper presents the theoretical framework of the...