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DATE
2007
IEEE
99views Hardware» more  DATE 2007»
14 years 2 months ago
A non-intrusive isolation approach for soft cores
Cost effective SOC test strongly hinges on parallel, independent test of SOC cores, which can only be ensured through proper core isolation techniques. While a core isolation mech...
Ozgur Sinanoglu, Tsvetomir Petrov
ISQED
2007
IEEE
206views Hardware» more  ISQED 2007»
14 years 2 months ago
Provisioning On-Chip Networks under Buffered RC Interconnect Delay Variations
Abstract—A Network-on-Chip (NoC) replaces on-chip communication implemented by point-to-point interconnects in a multi-core environment by a set of shared interconnects connected...
Mosin Mondal, Tamer Ragheb, Xiang Wu, Adnan Aziz, ...
FCCM
2005
IEEE
107views VLSI» more  FCCM 2005»
14 years 1 months ago
Simplifying the Integration of Processing Elements in Computing Systems Using a Programmable Controller
As technology sizes decrease and die area increases, designers are creating increasingly complex computing systems using FPGAs. To reduce design time for new products, the reuse o...
Lesley Shannon, Paul Chow
DATE
2003
IEEE
131views Hardware» more  DATE 2003»
14 years 1 months ago
High Speed and Highly Testable Parallel Two-Rail Code Checker
In this article we propose a high speed and highly testable parallel two-rail code checker, which features a compact structure and is Totally-Self-Checking or Strongly Code-Disjoi...
Martin Omaña, Daniele Rossi, Cecilia Metra
ISCA
2010
IEEE
413views Hardware» more  ISCA 2010»
14 years 1 months ago
Resistive computation: avoiding the power wall with low-leakage, STT-MRAM based computing
As CMOS scales beyond the 45nm technology node, leakage concerns are starting to limit microprocessor performance growth. To keep dynamic power constant across process generations...
Xiaochen Guo, Engin Ipek, Tolga Soyata