1175 search results - page 12 / 235 » A scalable method for the generation of small test sets |
UAI
2008
13 years 9 months ago
2008
Confidence measures for the generalization error are crucial when small training samples are used to construct classifiers. A common approach is to estimate the generalization err...
EURODAC
1994
IEEE
13 years 12 months ago
1994
IEEE
This paper presents an algorithm for generation of test patterns for strong robust path delay faults, i.e. tests that propagate the fault along a single path and additionally are ...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
This paper presents a method of generating tests for transition faults using tests for stuck-at faults such that the peak power is the minimum possible using a given set of tests ...
DATE
2000
IEEE
14 years 5 days ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
ATS
2003
IEEE
14 years 1 months ago
2003
IEEE
We present a framework for high-level design validation using an efficient register-transfer level (RTL) automatic test pattern generator (ATPG). The RTL ATPG generates the test ...