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DAC
2009
ACM
14 years 7 months ago
Fault models for embedded-DRAM macros
In this paper, we compare embedded-DRAM (eDRAM) testing to both SRAM testing and commodity-DRAM testing, since an eDRAM macro uses DRAM cells with an SRAM interface. We first star...
Ching-Yu Chin, Hao-Yu Yang, Mango Chia-Tso Chao, R...
DAC
2008
ACM
14 years 7 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
DAC
1998
ACM
14 years 7 months ago
Functional Vector Generation for HDL Models Using Linear Programming and 3-Satisfiability
Abstract-Our strategy for automatic generation of functional vectors is based on exercising selected paths in the given hardware description language (HDL) model. The HDL model des...
Farzan Fallah, Srinivas Devadas, Kurt Keutzer
HPDC
2010
IEEE
13 years 7 months ago
ParaText: scalable text modeling and analysis
Automated analysis of unstructured text documents (e.g., web pages, newswire articles, research publications, business reports) is a key capability for solving important problems ...
Daniel M. Dunlavy, Timothy M. Shead, Eric T. Stant...
DAC
2006
ACM
14 years 7 months ago
Efficient simulation of critical synchronous dataflow graphs
Simulation and verification using electronic design automation (EDA) tools are key steps in the design process for communication and signal processing systems. The synchronous dat...
Chia-Jui Hsu, José Luis Pino, Ming-Yung Ko,...