10 search results - page 2 / 2 » Accelerated test pattern generation by cone-oriented circuit... |
ICCAD
1998
IEEE
13 years 11 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
ISCAS
2007
IEEE
14 years 1 months ago
2007
IEEE
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
FPL
2004
Springer
14 years 26 days ago
2004
Springer
Abstract. We present an evaluation of accelerating fault simulation by hardware emulation on FPGA. Fault simulation is an important subtask in test pattern generation and it is fre...
DSD
2005
IEEE
14 years 1 months ago
2005
IEEE
Current paper presents new alternatives for accelerating the task of fault simulation for sequential circuits by hardware emulation on FPGA. Fault simulation is an important subta...
ITC
2003
IEEE
14 years 22 days ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...