Delay faults are an increasingly important test challenge. Traditional open and bridge fault models are incomplete because only the functional fault or a subset of delay fault are...
Zhuo Li, Xiang Lu, Wangqi Qiu, Weiping Shi, D. M. ...
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
We report the successful application of a resistive bridging fault (RBF) simulator to industrial benchmark circuits. Despite the slowdown due to the consideration of the sophistic...
We present three resistive bridging fault models valid for different CMOS technologies. The models are partitioned into a general framework (which is shared by all three models) a...