21183 search results - page 137 / 4237 » Adaptive Testing by Test |
130
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EOR
2010
15 years 4 months ago
2010
Continuous GRASP (C-GRASP) is a stochastic local search metaheuristic for finding cost-efficient solutions to continuous global optimization problems subject to box constraints (Hi...
118
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GECCO
2005
Springer
15 years 10 months ago
2005
Springer
Several general purpose benchmark generators are now available in the literature. They are convenient tools in dynamic continuous optimization as they can produce test instances w...
119
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ATS
2000
IEEE
15 years 9 months ago
2000
IEEE
We present a new pseudorandom testing algorithm for the Built-In Self-Test (BIST) of DRAM. In this algorithm, test patterns are complemented to generate state-transitions that are...
119
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ICCAD
1994
IEEE
15 years 8 months ago
1994
IEEE
This paper proposes a test approach and circuitry suitable for built-in self-test (BIST) of digital-to-analog (D/A) and analog-to-digital (A/D) converters. Offset, gain, linearity...
120
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CHES
2005
Springer
15 years 10 months ago
2005
Springer
Nearly half a century ago, military organizations introduced “Tempest” emission-security test standards to control information leakage from unintentional electromagnetic emanat...