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CORR
2010
Springer
149views Education» more  CORR 2010»
15 years 4 months ago
Group Testing with Probabilistic Tests: Theory, Design and Application
Identification of defective members of large populations has been widely studied in the statistics community under the name of group testing. It involves grouping subsets of items...
Mahdi Cheraghchi, Ali Hormati, Amin Karbasi, Marti...
DATE
2007
IEEE
100views Hardware» more  DATE 2007»
15 years 10 months ago
SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon W...
126
Voted
EUROMICRO
2003
IEEE
15 years 9 months ago
Merging components and testing tools: The Self-Testing COTS Components (STECC) Strategy
Development of a software system from existing components can surely have various benefits, but can also entail a series of problems. One type of problems is caused by a limited ...
Sami Beydeda, Volker Gruhn
135
Voted
ET
2002
90views more  ET 2002»
15 years 3 months ago
Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...
Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan M...
117
Voted
DAC
1999
ACM
16 years 4 months ago
Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme
Huan-Chih Tsai, Kwang-Ting Cheng, Sudipta Bhawmik