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    GLVLSI
    1998
    IEEE
    106views VLSI» more  GLVLSI 1998»
    Test Compaction for Synchronous Sequential Circuits by Test Sequence Recycling
    15 years 11 months ago
    Test Compaction for Synchronous Sequential Circuits by Test Sequence Recycling
    Download  www.cs.york.ac.uk
    Irith Pomeranz, Sudhakar M. Reddy
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    HASE
    1998
    IEEE
    128views Control Systems» more  HASE 1998»
    In-Parameter-Order: A Test Generation Strategy for Pairwise Testing
    15 years 11 months ago
    In-Parameter-Order: A Test Generation Strategy for Pairwise Testing
    Download  www-cse.uta.edu
    Yu Lei, Kuo-Chung Tai
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    VTS
    1996
    IEEE
    75views Hardware» more  VTS 1996»
    A new test pattern generation method for delay fault testing
    15 years 11 months ago
    A new test pattern generation method for delay fault testing
    Download  www.lirmm.fr
    S. Cremoux, Christophe Fagot, Patrick Girard, Chri...
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    DAC
    1992
    ACM
    93views Computer Architecture» more  DAC 1992»
    SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits
    15 years 11 months ago
    SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits
    Download  poisson.usc.edu
    Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer
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    ITC
    1992
    IEEE
    93views Hardware» more  ITC 1992»
    Self-Test Scheduling with Bounded Test Execution
    15 years 11 months ago
    Self-Test Scheduling with Bounded Test Execution
    Download  etdncku.lib.ncku.edu.tw
    Albrecht P. Stroele
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