2451 search results - page 59 / 491 » Alternative Test Methods Using IEEE 1149.4 |
ISMAR
2005
IEEE
14 years 1 months ago
2005
IEEE
Computer Aided Design applications have become designers’ inevitable tools for expressing and simulating innovative ideas and concepts. However, replacing traditional materials ...
DATE
1999
IEEE
14 years 2 days ago
1999
IEEE
In this paper we show that the already known method of using multiplexers for making the inputs and outputs of the embedded blocks accessible by the primary ports of the Integrate...
DATE
2003
IEEE
14 years 1 months ago
2003
IEEE
Reduction of both the test suite size and the download time of test vectors is important in today's System-On-a-Chip designs. In this paper, a method for compressing the scan...
ICRA
2006
IEEE
14 years 1 months ago
2006
IEEE
— A numerical simulation of the magnetic field in the imaging volume of a magnetic resonance imaging (MRI) scanner and a method for quick searches for electromagnetic noise sour...
ICCAD
2000
IEEE
14 years 4 days ago
2000
IEEE
A method to select the lengths of functional sequences in a BIST scheme for scan designs is proposed in this paper. A functional sequence is a sequence of primary input vectors ap...