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ISCA
2000
IEEE
13 years 11 months ago
2000
IEEE
While architects understandhow to build cost-effective parallel machines across a wide spectrum of machine sizes (ranging from within a single chip to large-scale servers), the re...
SIGCOMM
2012
ACM
11 years 9 months ago
2012
ACM
As live streaming networks grow in scale and complexity, they are becoming increasingly difficult to evaluate. Existing evaluation methods including lab/testbed testing, simulati...
ICCD
2008
IEEE
14 years 4 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
DAC
2002
ACM
14 years 8 months ago
2002
ACM
In this paper we propose a novel integrated circuit and architectural level technique to reduce leakage power consumption in high performance cache memories using single Vt (trans...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...